Advanced techniques for microstructural characterization /Trans Tech Publications, proceedings of Indo-Us workshop sponsored by the department of science & technology, Govt. of India and office of naval research, Washington, D. C., U.S.A., held at Bombay during January 11-13, 1988
Material type: TextPublication details: Switzerland: Trans Tech Publications, 1988 Description: 275pSubject(s):Item type | Current library | Call number | Materials specified | Status | Date due | Barcode |
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Proceedings | National Science Library | 539.24(082.2) M8 (Browse shelf(Opens below)) | Available | 170348 |
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539.23(082.2) K6 Basic problems in thin film physics | 539.23(082.2) P0 Seminar on measurement techniques for thin film characterization | 539.23(082.2) P4 Thin film preparation and characterization techniques for energy conversion (TFPCT-2004) | 539.24(082.2) M8 Advanced techniques for microstructural characterization | 539.26 J7 X-ray crystal structure | 539.26:539.125.5(082.2) M7 Neutron radiography | 539.3 K3.1 Theory of elasticity |
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