Pattern recognition and machine learning  
/Proceeding of the Japan-U S seminar on the learning process in control systems held in Nagoya Japan, August 18-20, 1970 
 - New York:   Plenum Press,  1971 
 - ix, 343p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Pattern recognition 
<br/><br/><label>Subjects--Index Terms: </label>Machine learning  
<br/><br/><label>Universal Decimal Class. No.: </label>519.71(082.2)  / L1