Nishina, Yuichiro <br/><br/>
Measurement of minority carrier lifetimes in semiconductors 

 - Iowa:   Ames Laboratory,   1957 
 - iv, 35p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Report
<br/><br/><label>Universal Decimal Class. No.: </label>537.311.33  / J7