Defect recognition and image processing in III-V compounds 
/ Proceedings of the international symposium on defect recognition and image...............................2-4 July, 1985 
 - Amsterdam:   Elsevier,   1985 
 - xii, 306p. 
<br/><br/><label>ISBN: </label>0-444-2558-6 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Proceedings
<br/><br/><label>Universal Decimal Class. No.: </label>620.19:621(082.2)  / M5