Defects in semiconductors II /Proceeding of the materials research society annual meeting november 1982 in Boston, Massachusetts USA - New York: North Holland, 1983 - xv, 582p. ISBN: 0-444-00812-8 Subjects--Topical Terms: Semiconductors Subjects--Index Terms: Defects Universal Decimal Class. No.: 621.315.592(082.2) / M3