Advances in x-ray analysis 

 - New York:   Plenum Press,   1985 
 - xv, 393p. 
<br/><br/> Vol. 28 
<br/><br/><label>ISBN: </label>0-306-41393-4 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-Ray analysis
<br/><br/><label>Subjects--Index Terms: </label>Surface analysis techniques