| 000 | 00474nam a22001577a 4500 | ||
|---|---|---|---|
| 008 | 230427b |||||||| |||| 00| 0 eng d | ||
| 040 |
_aNational Science Library _cNational Science Library |
||
| 080 |
_a537.311.33 _bJ7 |
||
| 100 | 1 |
_aNishina, Yuichiro _97700 |
|
| 245 | _aMeasurement of minority carrier lifetimes in semiconductors | ||
| 260 |
_aIowa: _bAmes Laboratory, _c1957 |
||
| 300 | _aiv, 35p. | ||
| 650 | _aReport | ||
| 700 | _aDanielson, G C | ||
| 942 |
_2udc _cREP |
||
| 999 |
_c24396 _d24396 |
||