000 00509nam a22001457a 4500
008 230503b |||||||| |||| 00| 0 eng d
020 _a0-444-87744-4
040 _aNational Science Library
_cNational Science Library
080 _a681.7.014.3(082.2)
_bM5
245 _aVision'85:
_bConference proceedings, March 25-28, 1985, Detroit, Michigan
_c/ Machine Vision Association of SME
260 _aAmsterdam:
_bNorth Holland,
_c1985
650 _aIndustries
653 _aFlaw detection
942 _2udc
_cPR
999 _c26720
_d26720