000 00481nam a22001577a 4500
008 230504b |||||||| |||| 00| 0 eng d
040 _aNational Science Library
_cNational Science Library
080 _a621.383.001(082.2)
_bL9
245 _aNondestructive evaluation of semiconductor materials and devices
260 _aLondon:
_bPlenum Press,
_c1979
300 _axi, 782p.
650 _aScience
653 _aPhysics
700 _aZemel, Jay N (Ed.)
942 _2udc
_cBK
999 _c40434
_d40434