000 00600nam a22001577a 4500
008 230607b |||||||| |||| 00| 0 eng d
020 _a0-444-2558-6
040 _aNational Science Library
_cNational Science Library
080 _a620.19:621(082.2)
_bM5
245 _aDefect recognition and image processing in III-V compounds
_c/ Proceedings of the international symposium on defect recognition and image...............................2-4 July, 1985
260 _aAmsterdam:
_bElsevier,
_c1985
300 _axii, 306p.
650 _aProceedings
700 _aFillard, J P (Ed.)
942 _2udc
_cPR
999 _c40618
_d40618