000 00309nam a22001097a 4500
008 230720b |||||||| |||| 00| 0 eng d
022 _a0026-2714
040 _aNational Science Library
_cNational Science Library
245 _aMicroelectronics reliability
260 _aOxford:
_bPergamon Press,
942 _cCR
999 _c53855
_d53855