opac-header

Defects in semiconductors (Record no. 42455)

MARC details
000 -LEADER
fixed length control field 00598nam a22001697a 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230612b |||||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0-444-00596-X
040 ## - CATALOGING SOURCE
Original cataloging agency National Science Library
Transcribing agency National Science Library
080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER
Universal Decimal Classification number 621.315.592:620(082.2)
Item number M1
245 ## - TITLE STATEMENT
Title Defects in semiconductors
Statement of responsibility, etc. /Proceeding of the materials research society annual meeting november 1980 Copley plaza hotel Boston Massachusetts USA
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New York:
Name of publisher, distributor, etc. North Holland,
Date of publication, distribution, etc. 1980
300 ## - PHYSICAL DESCRIPTION
Extent xi, 537p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductors
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Defects
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Narayan J (Ed.)
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Universal Decimal Classification
Koha item type Proceedings
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Shelving location Date acquired Serial Enumeration / chronology Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Universal Decimal Classification     National Science Library National Science Library GF/Rk-12/C-22/R-1 08/01/1982 Vol. 2   621.315.592:620(082.2) M1 100899 12/06/2023 12/06/2023 Proceedings