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Ellipsometry in the measurement of surfaces and thin films (Record no. 56438)

MARC details
000 -LEADER
fixed length control field 00465nam a22001337a 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230721b |||||||| |||| 00| 0 eng d
040 ## - CATALOGING SOURCE
Original cataloging agency National Science Library
Transcribing agency National Science Library
245 ## - TITLE STATEMENT
Title Ellipsometry in the measurement of surfaces and thin films
Statement of responsibility, etc. / U. S. Department of Commerce
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. California:
Name of publisher, distributor, etc. U. S. Department of Commerce,
Date of publication, distribution, etc. 1963
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Automation
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Indexing
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Passaglia, E (Ed.)
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Universal Decimal Classification
Koha item type Reports

No items available.