Normal view MARC view ISBD view

Measurement of minority carrier lifetimes in semiconductors

By:

Contributor(s):

Material type: Text

TextPublication details: Iowa: Ames Laboratory, 1957Description: iv, 35pSubject(s):

Item type: Reports

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Reports	National Science Library	537.311.33 J7 (Browse shelf(Opens below))		Available		11360

There are no comments on this title.

to post a comment.