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Ellipsometry in the measurement of surfaces and thin films / U. S. Department of Commerce

Contributor(s): Material type: TextTextPublication details: California: U. S. Department of Commerce, 1963Subject(s):
Item type: Reports
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Item type Current library Call number Materials specified Status Date due Barcode
Reports National Science Library 535.5.08(063) K4 (Browse shelf(Opens below)) Available 12519

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