Emerging nanotechnologies: Test, defect tolerance and reliability
Material type: TextPublication details: USA: Springer, 2008Description: xii, 405pISBN:- 978-0387-74746-0
Item type | Current library | Collection | Call number | Materials specified | Status | Date due | Barcode |
---|---|---|---|---|---|---|---|
Reference | National Science Library | Reference | 66.017 P8 (Browse shelf(Opens below)) | Not for loan | 250116 |
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