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Seminar on measurement techniques for thin film characterization

Seminar on measurement techniques for thin film characterization /Coimbatore Institute of Technology, March 3rd, 2000 - Coimbatore: Coimbatore Institute of Technology, 2000 - 50p.

Subjects--Topical Terms:
Measurement techniques

Subjects--Index Terms: Electron microscopy

Universal Decimal Class. No.: 539.23(082.2) / P0

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