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Seminar on measurement techniques for thin film characterization (Record no. 25206)

MARC details
000 -LEADER
fixed length control field 00541nam a22001457a 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230501b |||||||| |||| 00| 0 eng d
040 ## - CATALOGING SOURCE
Original cataloging agency National Science Library
Transcribing agency National Science Library
080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER
Universal Decimal Classification number 539.23(082.2)
Item number P0
245 ## - TITLE STATEMENT
Title Seminar on measurement techniques for thin film characterization
Statement of responsibility, etc. /Coimbatore Institute of Technology, March 3rd, 2000
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Coimbatore:
Name of publisher, distributor, etc. Coimbatore Institute of Technology,
Date of publication, distribution, etc. 2000
300 ## - PHYSICAL DESCRIPTION
Extent 50p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Measurement techniques
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Electron microscopy
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Universal Decimal Classification
Koha item type Proceedings
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Shelving location Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Universal Decimal Classification     National Science Library National Science Library GF/Rk-6/C-12/R-1 01/06/2000   539.23(082.2) P0 179096 01/05/2023 01/06/2000 Proceedings