Measurement of minority carrier lifetimes in semiconductors
Material type: TextPublication details: Iowa: Ames Laboratory, 1957Description: iv, 35pSubject(s):Item type | Current library | Call number | Materials specified | Status | Date due | Barcode |
---|---|---|---|---|---|---|
Reports | National Science Library | 537.311.33 J7 (Browse shelf(Opens below)) | Available | 11360 |
Browsing National Science Library shelves Close shelf browser (Hides shelf browser)
537.226(063) J5 Some aspects of ferroelectricity | 537.226(082.2) M6 Ferroelectrics and dielectrics | 537.226.4(082.2) P4 Advances in ferroelectrics and dielectrics | 537.311.33 J7 Measurement of minority carrier lifetimes in semiconductors | 537.311.33(048.1) K8 Abstracts | 537.311.33(05) K5 Progress in semiconductors | 537/538(044) L1.1 Selected correspondence of Michael Faraday |
There are no comments on this title.