Normal view MARC view ISBD view

Materials and process characterization for vlsi, 1988 (ICMC '88) / Proceedings of the international conference 24-29 October, 1988 Shangai, China

Contributor(s):

Material type: Text

TextPublication details: Singapore: World Scientific, 1988Description: xix, 531pISBN:

Subject(s):

Item type:

Proceedings

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Proceedings	National Science Library	621.3.049.77 M8 (Browse shelf(Opens below))		Available		170354

Previous
Previous	621.3.049.77 M1 Impact of microelectronics: A review of the literature technology policy unit, University of Aston, Birmingham	621.3.049.77 M3 Global race in microelectronics: Innovation and corporate strategies in a period of crisis	621.3.049.77 M5 Integrated circuit mask technology	621.3.049.77 M8 Materials and process characterization for vlsi, 1988 (ICMC '88)	621.3.049.77 N0 Principal of optical circuit engineering	621.3.049.77+681.326 M8 International conference on the impact of digital microelectronics and microprocessors on particle physics

There are no comments on this title.

to post a comment.