Seminar on measurement techniques for thin film characterization /Coimbatore Institute of Technology, March 3rd, 2000
Material type: TextPublication details: Coimbatore: Coimbatore Institute of Technology, 2000Description: 50pSubject(s):Item type | Current library | Call number | Materials specified | Status | Date due | Barcode |
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Proceedings | National Science Library | 539.23(082.2) P0 (Browse shelf(Opens below)) | Available | 179096 |
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